Title :
Fault Detection In Intelligent Material
Author_Institution :
National Science Foundation
Keywords :
Computer aided manufacturing; Computer integrated manufacturing; Costs; Fault detection; Intelligent sensors; Manufacturing automation; Manufacturing processes; Materials handling; Production facilities; Real time systems;
Conference_Titel :
Computer Integrated Manufacturing, 1992., Proceedings of the Third International Conference on
Print_ISBN :
0-8186-2615-1
DOI :
10.1109/CIM.1992.639116
