DocumentCode :
2672505
Title :
Test of glass electrical solidity for high - temperature protective layers
Author :
Tcenev, I. Valentin ; Fillipov, Filip
Author_Institution :
EPIQ EA, Botevgrad
fYear :
2006
fDate :
10-14 May 2006
Firstpage :
74
Lastpage :
79
Abstract :
Glass is the most used high-temperature protective layer in electronics and microelectronics. Reliability of the devices extremely depends on glass compactness and solidity. In this paper we present a test method for controlling glass solidity and compactness. In this case glass is protective layer for high-temperature sensor in automotive applications. The test method includes protective glass layer soaking with water under pressure and high-voltage insulation resistance measuring. The best test process parameters are defined after applying SPC (Statistical Process Control). For measure test system repeatability we applied MSA (Measurement System Analyze). On bases this investigations we can conclude that this test method is a simple control operation -not a real measurement. In this paper we describe also the test method improvement by applying Poka -Yoke solutions and automation for better using of tester system in mass production (requirements in this case are -stable test process under control with capability over than 1.67). After implementation of water test in our production as a control operation we have improved the production process of high -temperature sensor. The main result of our study helps for creation of stable test system (water test) for high -temperature sensors and this reduces the number of customer complaints significantly.
Keywords :
glass; materials testing; solidification; statistical process control; temperature sensors; thermal management (packaging); Poka -Yoke solution; SPC; automotive applications; glass compactness; glass electrical solidity testing; high-temperature protective layers; high-temperature sensor; insulation resistance measurement; measurement test system; microelectronics; production process; statistical process control; water test; Automatic control; Automatic testing; Electrical resistance measurement; Glass; Microelectronics; Process control; Production; Protection; System testing; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology, 2006. ISSE '06. 29th International Spring Seminar on
Conference_Location :
St. Marienthal
Print_ISBN :
1-4244-0551-3
Electronic_ISBN :
1-4244-0551-3
Type :
conf
DOI :
10.1109/ISSE.2006.365362
Filename :
4216002
Link To Document :
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