DocumentCode
2672883
Title
Automatic inspection of solder joints using layered illumination
Author
Kim, Tae-Hyeon ; Cho, Tai-Hoon ; Moon, Young-Shik ; Park, Sung-Han
Author_Institution
Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea
Volume
1
fYear
1996
fDate
16-19 Sep 1996
Firstpage
645
Abstract
Efficient techniques for solder joint inspection are described. Using three layers of ring shaped LEDs with different illumination angles, three frames of images are sequentially obtained. From these images the regions of interest (soldered regions) are segmented, and their characteristic features including the average gray level and the number of highlights-referred to as 2D features-are extracted. Based on the minimum distance classification rule, each solder joint is classified into one of the pre-defined types. If the classification is ambiguous, the distribution of tilt angles-referred to as 3D features-is calculated, which requires more computation while providing more information and better performance. The proposed inspection system has been implemented and tested with various types of solder joints in SMDs. The experimental results have verified the validity of this scheme in terms of speed and recognition rate
Keywords
automatic optical inspection; automatic test equipment; feature extraction; image segmentation; light emitting diodes; soldering; surface mount technology; 2D feature extraction; 3D features; SMD; automatic inspection; average gray level; experimental results; highlights; illumination angles; image frames; image segmentation; inspection system; layered illumination; minimum distance classification rule; performance; recognition rate; ring shaped LED; solder joint classification; solder joints; soldered regions; surface mounting technology; tilt angles distribution; Feature extraction; Image segmentation; Inspection; Light emitting diodes; Light sources; Lighting; Reflectivity; Soldering; Surface-mount technology; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 1996. Proceedings., International Conference on
Conference_Location
Lausanne
Print_ISBN
0-7803-3259-8
Type
conf
DOI
10.1109/ICIP.1996.560960
Filename
560960
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