• DocumentCode
    2673031
  • Title

    Investigations of Electrical Behaviours of Grain Bounadries in Polycrystalline Silicon Solar Cells by EBIC and OBIC

  • Author

    Kaczmarek, D. ; Domaradzki, J. ; Borkowska, A.

  • Author_Institution
    Wroclaw Univ. of Technol., Warsaw
  • fYear
    2006
  • fDate
    10-14 May 2006
  • Firstpage
    299
  • Lastpage
    303
  • Abstract
    In this work, an application of two non-destructive beam injection methods: Electron Beam Induced Current (EBIC) and Light Beam Induced Current (LBIC) for evaluation of electrical properties of grain boundaries in polycrystalline silicon solar cells have been described. The methods reveal study of the lateral distribution of the current generated by focused electron and light beams and thus the study of local recombination of the charge carriers due to the presence of boundaries.
  • Keywords
    EBIC; OBIC; elemental semiconductors; grain boundaries; hot carriers; silicon; solar cells; EBIC; LBIC; Si; charge carriers; electron beam induced current; focused electron generated current; grain boundaries; light beam induced current; polycrystalline silicon solar cells; Charge carriers; Costs; Electron beams; Fabrication; Grain boundaries; Optical beams; Photovoltaic cells; Semiconductor materials; Silicon; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2006. ISSE '06. 29th International Spring Seminar on
  • Conference_Location
    St. Marienthal
  • Print_ISBN
    1-4244-0551-3
  • Electronic_ISBN
    1-4244-0551-3
  • Type

    conf

  • DOI
    10.1109/ISSE.2006.365117
  • Filename
    4216047
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2673031