DocumentCode :
2673185
Title :
A study of the discharge phenomena of rhodium-plated contact reed switches
Author :
Kobayashi, T. ; Hinohara, K. ; Kawakita, C.
Author_Institution :
Oki Electr. Ind. Co. Ltd., Tokyo, Japan
fYear :
1990
fDate :
20-24 Aug 1990
Firstpage :
63
Lastpage :
66
Abstract :
The discharge phenomena of high-breakdown-voltage reed switches (such as the pressurized reed switch and the vacuum reed switch) and the discharge phenomena of general-purpose reed switches are studied with respect to their basic mechanism and reactions. The contact surface after discharge is analyzed, assuming that the carriers in the discharge must remain on them. The analysis revealed that the nitrogen cation and the oxygen anion serve as carriers in the discharge for the pressurized reed switch and general-purpose reed switch. For the vacuum reed switch, the oxygen anion triggers the discharge as a carrier
Keywords :
discharges (electric); reed relays; rhodium; N+ cation; O- anion; Rh plated switches; contact reed switches; contact surface; discharge carriers; discharge phenomena; general-purpose reed switches; high-breakdown-voltage reed switches; pressurized reed switch; vacuum reed switch; Contacts; Electron tubes; Glass; Information analysis; Nitrogen; Pressure control; Surface discharges; Switches; Switching circuits; Vacuum breakdown;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts
Conference_Location :
Montreal, Que.
Type :
conf
DOI :
10.1109/HOLM.1990.112997
Filename :
112997
Link To Document :
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