A study of the discharge phenomena of rhodium-plated contact reed switches

Author

Kobayashi, T. ; Hinohara, K. ; Kawakita, C.

Author_Institution

Oki Electr. Ind. Co. Ltd., Tokyo, Japan

fYear

1990

fDate

20-24 Aug 1990

Firstpage

63

Lastpage

66

Abstract

The discharge phenomena of high-breakdown-voltage reed switches (such as the pressurized reed switch and the vacuum reed switch) and the discharge phenomena of general-purpose reed switches are studied with respect to their basic mechanism and reactions. The contact surface after discharge is analyzed, assuming that the carriers in the discharge must remain on them. The analysis revealed that the nitrogen cation and the oxygen anion serve as carriers in the discharge for the pressurized reed switch and general-purpose reed switch. For the vacuum reed switch, the oxygen anion triggers the discharge as a carrier

Keywords

discharges (electric); reed relays; rhodium; N⁺ cation; O^- anion; Rh plated switches; contact reed switches; contact surface; discharge carriers; discharge phenomena; general-purpose reed switches; high-breakdown-voltage reed switches; pressurized reed switch; vacuum reed switch; Contacts; Electron tubes; Glass; Information analysis; Nitrogen; Pressure control; Surface discharges; Switches; Switching circuits; Vacuum breakdown;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts

Conference_Location

Montreal, Que.

Type

conf

DOI

10.1109/HOLM.1990.112997

Filename

112997