• DocumentCode
    2673324
  • Title

    Theil index for aggregation of software metrics values

  • Author

    Serebrenik, Alexander ; van den Brand, Mark

  • Author_Institution
    Tech. Univ. Eindhoven, Eindhoven, Netherlands
  • fYear
    2010
  • fDate
    12-18 Sept. 2010
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    We propose a new approach to aggregating software metrics from the micro-level of individual artifacts (e.g., methods, classes and packages) to the macro-level of the entire software system. The approach, Theil index, is a well-known econometric measure of inequality. The Theil index allows to study the impact of different categorizations of the artifacts, e.g., based on the development technology or developers´ teams, on the inequality of the metrics values measured. We apply the Theil index in a series of experiments. We have observed that the Theil index and the related notions provide valuable insights in organization and evolution of software systems, as well as in sources of inequality.
  • Keywords
    econometrics; software metrics; Theil index; econometric inequality measure; software metrics aggregation; software metrics values; Econometrics; Indexes; Software metrics; Software systems; Theil index; distribution; software metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Maintenance (ICSM), 2010 IEEE International Conference on
  • Conference_Location
    Timisoara
  • ISSN
    1063-6773
  • Print_ISBN
    978-1-4244-8630-4
  • Electronic_ISBN
    1063-6773
  • Type

    conf

  • DOI
    10.1109/ICSM.2010.5609637
  • Filename
    5609637