DocumentCode
2673324
Title
Theil index for aggregation of software metrics values
Author
Serebrenik, Alexander ; van den Brand, Mark
Author_Institution
Tech. Univ. Eindhoven, Eindhoven, Netherlands
fYear
2010
fDate
12-18 Sept. 2010
Firstpage
1
Lastpage
9
Abstract
We propose a new approach to aggregating software metrics from the micro-level of individual artifacts (e.g., methods, classes and packages) to the macro-level of the entire software system. The approach, Theil index, is a well-known econometric measure of inequality. The Theil index allows to study the impact of different categorizations of the artifacts, e.g., based on the development technology or developers´ teams, on the inequality of the metrics values measured. We apply the Theil index in a series of experiments. We have observed that the Theil index and the related notions provide valuable insights in organization and evolution of software systems, as well as in sources of inequality.
Keywords
econometrics; software metrics; Theil index; econometric inequality measure; software metrics aggregation; software metrics values; Econometrics; Indexes; Software metrics; Software systems; Theil index; distribution; software metrics;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Maintenance (ICSM), 2010 IEEE International Conference on
Conference_Location
Timisoara
ISSN
1063-6773
Print_ISBN
978-1-4244-8630-4
Electronic_ISBN
1063-6773
Type
conf
DOI
10.1109/ICSM.2010.5609637
Filename
5609637
Link To Document