Title :
A Simple Detection Method For RLL Codes
Author :
Nakagawa, T. ; Ino, H. ; Shimpuku, Y.
Author_Institution :
Sony Corporation,
Keywords :
Binary sequences; Bit error rate; Channel capacity; Circuits; Detectors; Error correction; Error correction codes; Jitter; Laboratories; Memory;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597858
