Title :
The device of research on relay contact reliability
Author :
Lu Jianguo ; Zhigang, Li ; Jinqin, Wang
Author_Institution :
Hebei Inst. of Technol., Tianjin, China
Abstract :
A device for research into relay contact reliability is described. Since 64 pairs of contacts may be monitored at the same time, the device can be used to statistically research the contact resistance of relay contacts. The contact drop of all the contacts can be measured periodically and automatically, and thus the device may be used to investigate the variations of contact resistance throughout the life of the test relays. The device can also be used for reliability tests, since contact drop and open circuit voltage are measured at every operation. Failure occurs if the contact drop is too high or the open circuit voltage is too low. Test results and the method of data processing are discussed and analyzed
Keywords :
electrical contacts; life testing; relays; reliability; contact drop; contact resistance; data processing; life; open circuit voltage; relay contact reliability; Automatic testing; Circuit testing; Contact resistance; Data processing; Electrical resistance measurement; Life testing; Low voltage; Monitoring; Relays; Voltage measurement;
Conference_Titel :
Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts
Conference_Location :
Montreal, Que.
DOI :
10.1109/HOLM.1990.113003
