Title :
Internal winding failure due to resonance overvoltage in distribution transformer caused by winter lightning
Author :
Hori, Masahiko ; Nishioka, Minoru ; Ikeda, Yukio ; Noguchi, Kouji ; Kajimura, Kazunari ; Motoyama, Hideki ; Kawamura, Tatsuo
Author_Institution :
Hokuriku Electr. Power Co.
Abstract :
Summary form only given. In this paper, we describe the internal winding failures of the No. 3 distribution transformer at Katayamazu substation caused by winter lightning. Almost the same internal winding part of the transformer was damaged in January 1997 and November 2001. Therefore, detailed investigations of the cause of failures were carried out. From the investigations on the measurement of the frequency characteristics of transformer windings and detailed lightning surge analysis used by electro-magnetic transients program (EMTP), it was found that resonance overvoltages were generated by resonance phenomena between the surge waveform passing through the transformer and the natural frequency characteristics of the transformer winding. This finding was used to improve the winding form of tap windings and install a surge protection device between tap windings. After the improvement of winding structures, it was clearly shown that the internal stress of tap windings was reduced and the breakdown probability of the damaged part was significantly reduced
Keywords :
EMTP; failure analysis; frequency measurement; lightning; overvoltage; power transformer protection; substations; surge protection; transformer windings; EMTP; Katayamazu substation; No. 3 distribution transformer; breakdown probability; electro-magnetic transients program; frequency measurement; internal winding failure; lightning surge analysis; resonance overvoltage; surge protection device; surge waveform; tap windings; winding structures; winter lightning; EMTP; Frequency measurement; Lightning; Resonance; Substations; Surge protection; Surges; Transient analysis; Voltage control; Windings;
Conference_Titel :
Power Engineering Society General Meeting, 2006. IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
1-4244-0493-2
DOI :
10.1109/PES.2006.1708981