• DocumentCode
    2673754
  • Title

    The lifetime and reliability of insulation displacement contacts with solid and stranded wires

  • Author

    Groenendijk, H.A. ; Spruijt, T.

  • Author_Institution
    PTT Res. Neher Lab., Leidschendam, Netherlands
  • fYear
    1990
  • fDate
    20-24 Aug 1990
  • Firstpage
    166
  • Lastpage
    173
  • Abstract
    To determine the lifetime and reliability of insulation displacement connections with solid and stranded wires for use in telecommunication equipment, dry heat tests at 100°C and 70°C were carried out. The duration of these tests was up to three years. Temperature cycle tests between 20 and 80°C were also made. The increase of the contact resistance in these tests is compared with the resistance increase of connectors kept at laboratory conditions. Both solid wires (0.5 and 0.4 mm) and stranded wires (7×0.20 mm, 7×0.16 mm, and 18×0.10 mm) with and without tin plating were tested in insulation displacement slots of three different manufacturers. It is found that the slots tested with solid wires have a stable contact resistance, while some of the slots with stranded wires showed an increase of the contact resistance. This was strongest for the 18-strand wires. The test results are compared with the spring constant and springback of the insulation displacement slot. Criteria for the evaluation of the lifetime and reliability of insulation displacement connections are discussed
  • Keywords
    electric connectors; electrical contacts; life testing; reliability; 20 to 100 degC; contact resistance; dry heat tests; insulation displacement contacts; lifetime; reliability; solid wires; spring constant; springback; stranded wires; telecommunication equipment; Cable insulation; Connectors; Contact resistance; Insulation testing; Laboratories; Life testing; Solids; Temperature; Tin; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts
  • Conference_Location
    Montreal, Que.
  • Type

    conf

  • DOI
    10.1109/HOLM.1990.113010
  • Filename
    113010