Title :
Application-level fault tolerance in the orbital thermal imaging spectrometer
Author :
Ciocca, E. ; Koren, I. ; Koren, Z. ; Krishna, C.M. ; Katz, D.S.
Author_Institution :
Massachusetts Univ., Amherst, MA, USA
Abstract :
Systems that operate in extremely volatile environments, such as orbiting satellites, must be designed with a strong emphasis on fault tolerance. Rather than rely solely on the system hardware, it may be beneficial to entrust some of the fault handling to software at the application level, which can utilize semantic information and software communication channels to achieve fault tolerance with considerably less power and performance overhead. We show the implementation and evaluation of such a software-level approach, application-level fault tolerance and detection (ALFTD) into the orbital thermal imaging spectrometer (OTIS).
Keywords :
error detection; error statistics; infrared imaging; infrared spectrometers; software fault tolerance; spectroscopy computing; application-level fault tolerance; error statistics; fault detection; orbital thermal imaging spectrometer; software based fault tolerance; Application software; Communication channels; Communication system software; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Satellites; Software performance; Spectroscopy;
Conference_Titel :
Dependable Computing, 2004. Proceedings. 10th IEEE Pacific Rim International Symposium on
Print_ISBN :
0-7695-2076-6
DOI :
10.1109/PRDC.2004.1276551