Title :
Investigation of Surface Flashover on Dielectrics Enhanced by Excimer Laser Processing
Author :
Sarjeant, W.J. ; Zirnheld, J. ; Berkow, J. ; Strzempka, P. ; Cieri, J.
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Buffalo, NY
Abstract :
One of the factors that contributes to surface flashover on dielectrics is the existence of defects on the surface of the material. For our studies, excimer laser processing was utilized on alumina dielectrics in an attempt to substantially increase the threshold voltages for flashover. Through excimer laser processing, the surface material melts and re-crystallizes to form a uniform surface structure. The defects on the dielectric surface can be minimized, reducing charge trapping, leading to higher flashover voltages. Two sets of samples were tested. The first set of samples was processed using the laser and the second set was not. The samples were then stressed under high voltage to induce surface flashover. Analysis of the effects of the excimer laser processing was performed and are shown
Keywords :
alumina; ceramic insulators; dielectric materials; flashover; insulator testing; laser beam applications; laser materials processing; vacuum arcs; vacuum insulation; alumina dielectrics; excimer laser processing; insulator testing; surface flashover; Annealing; Dielectric materials; Electron traps; Flashover; Grain size; Insulation; Optical materials; Surface charging; Surface emitting lasers; Voltage; Alumina; Ceramic Insulation; Electric Breakdown; Flashover; Partial Discharges; Scanning Electron Microscopy;
Conference_Titel :
Power Modulator Symposium, 2006. Conference Record of the 2006 Twenty-Seventh International
Conference_Location :
Arlington, VA
Print_ISBN :
1-4244-0018-X
Electronic_ISBN :
1-4244-0019-8
DOI :
10.1109/MODSYM.2006.365186