• DocumentCode
    2674079
  • Title

    ADC spectral performance measurement uncertainty in DFT method

  • Author

    Duan, Jingbo ; Chen, Degang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • fYear
    2011
  • fDate
    15-17 May 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Spectral performances are important specifications need to be measured for many analog and RF circuits. Measurement errors of these performances are random variables related to additive noise which is normal distributed. Few research results on measurement error can be found in literature. Therefore accuracy or error of measurement is usually estimated by experience. This paper presents rigorous analyses of measurement error of THD and SFDR in DFT testing. Analyses are validated by Matlab simulations and provide useful guidance on how to select number of samples to achieve certain accuracy and confidence level in real testing.
  • Keywords
    analogue integrated circuits; analogue-digital conversion; discrete Fourier transforms; measurement errors; radiofrequency integrated circuits; ADC spectral performance; Matlab simulations; RF circuits; SFDR; THD; additive noise; analog circuits; discrete Fourier transform; measurement errors; measurement uncertainty; random variables; Accuracy; Additive noise; Discrete Fourier transforms; Harmonic analysis; Testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology (EIT), 2011 IEEE International Conference on
  • Conference_Location
    Mankato, MN
  • ISSN
    2154-0357
  • Print_ISBN
    978-1-61284-465-7
  • Type

    conf

  • DOI
    10.1109/EIT.2011.5978612
  • Filename
    5978612