DocumentCode :
2674242
Title :
Terahertz testing of adhesive bonds
Author :
Dürrschmidt, Stefan F. ; Wietzke, Steffen ; Jansen, Christian ; Wang, Haiyan ; Zhao, Guozhong ; Koch, Martin
Author_Institution :
Dept. of Phys., Univ. Marburg, Marburg, Germany
fYear :
2011
fDate :
2-7 Oct. 2011
Firstpage :
1
Lastpage :
2
Abstract :
So far, the strong demand for non-destructive testing of adhesive bonds has not sufficiently been met. Here, we demonstrate the capability of terahertz time-domain spectroscopy as a non-destructive technique for the analysis of adhesive layers in terms of thickness and dielectric properties by inspecting three different material systems.
Keywords :
adhesive bonding; adhesives; inspection; nondestructive testing; terahertz spectroscopy; adhesive bonds; dielectric properties; inspection; nondestructive testing; terahertz time domain spectroscopy; Adhesives; Permittivity; Polymers; Spectroscopy; Testing; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
ISSN :
2162-2027
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
Type :
conf
DOI :
10.1109/irmmw-THz.2011.6105000
Filename :
6105000
Link To Document :
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