DocumentCode :
2674268
Title :
The development of a compact millimeter wave scanning system
Author :
Krebs, C. ; Warok, P. ; Heinen, S. ; Brauns, R. ; Hommes, A. ; Kose, S. ; Teichrib, W. ; Gütgemann, S. ; Nussler, D.
Author_Institution :
Dept. MHS, Fraunhofer FHR, Wachtberg, Germany
fYear :
2011
fDate :
2-7 Oct. 2011
Firstpage :
1
Lastpage :
2
Abstract :
The following paper describes the development of an autonomous and compact millimeter wave scanning measurement system (SAMMI - Stand Alone Millimeter wave Imager) which works in the W-Band (CW@78GHz). SAMMI® was developed to demonstrate the high potential and usability of the millimeter wave region for material classification[1].
Keywords :
inspection; millimetre wave detectors; millimetre wave imaging; millimetre wave measurement; nondestructive testing; SAMMI; compact millimeter wave scanning system; stand alone millimeter wave imager; Frequency measurement; Impurities; Millimeter wave measurements; Millimeter wave technology; Phase measurement; Pollution measurement; Receivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
ISSN :
2162-2027
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
Type :
conf
DOI :
10.1109/irmmw-THz.2011.6105003
Filename :
6105003
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2674268
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