DocumentCode :
2674381
Title :
An Eclipse plug-in for the detection of design pattern instances through static and dynamic analysis
Author :
De Lucia, Andrea ; Deufemia, Vincenzo ; Gravino, Carmine ; Risi, Michele
Author_Institution :
Dipt. di Mat. e Inf., Univ. degli Studi di Salerno, Fisciano, Italy
fYear :
2010
fDate :
12-18 Sept. 2010
Firstpage :
1
Lastpage :
6
Abstract :
The extraction of design pattern information from software systems can provide conspicuous insight to software engineers on the software structure and its internal characteristics. In this demonstration we present ePAD, an Eclipse plug-in for recovering design pattern instances from object-oriented source code. The tool is able to recover design pattern instances through a structural analysis performed on a data model extracted from source code, and a behavioral analysis performed through the instrumentation and the monitoring of the software system. ePAD is fully configurable since it allows software engineers to customize the design pattern recovery rules and the layout used for the visualization of the recovered instances.
Keywords :
object-oriented programming; program diagnostics; software tools; Eclipse plug-in; design pattern detection; design pattern information extraction; design pattern recovery rules; dynamic analysis; ePAD; object-oriented source code; software engineers; software systems; static analysis; Eclipse plug-in; design pattern recovery; reverse engineering; source code analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Maintenance (ICSM), 2010 IEEE International Conference on
Conference_Location :
Timisoara
ISSN :
1063-6773
Print_ISBN :
978-1-4244-8630-4
Electronic_ISBN :
1063-6773
Type :
conf
DOI :
10.1109/ICSM.2010.5609707
Filename :
5609707
Link To Document :
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