• DocumentCode
    267443
  • Title

    Temperature effect on performance and reliability of QR tapped-inductor Buck LED driver

  • Author

    Weiming Lin ; Qingliang Zheng ; Yuzhen Xu ; Qiang Zhang

  • Author_Institution
    Dept. of Power Electron., Fuzhou Univ., Fuzhou, China
  • fYear
    2014
  • fDate
    5-8 Nov. 2014
  • Firstpage
    1397
  • Lastpage
    1400
  • Abstract
    LED has promised to replace conventional light sources with impressive economic and environmental saving because of the realization of high efficiency and long life time light sources. Reliability issue is a key factor affecting the lighting quality and life time of LED lighting system. Each LED system includes two major aspects; optical and electrical driver. The LED driver is one of the weakest components in the LED luminaries and they tend to degrade rapidly with increasing temperature. The effect of temperature on performance and reliability of LED driver is analyzed in this paper. A thermal simulation model based on a tapped-inductor quasi-resonant Buck LED driver was set up. The thermal field and thermal stress analysis of the driver was done by using the software EFD Pro 8.2. The losses from various components of the driver were calculated in detail. The histogram of losses in various components in the driver was given. Computer simulation and a prototype rated at 5W, with an input ac voltage of 176-265Vrms and an output current of 700mA has been implemented to verify the prediction.
  • Keywords
    LED lamps; driver circuits; lighting; power engineering computing; reliability; thermal stresses; LED lighting system life time; LED luminaries; QR tapped-inductor buck LED driver reliability; computer simulation; current 700 mA; economic saving; electrical driver; environmental saving; light source efficiency; light source lifetime; light sources; lighting quality; optical driver; power 5 W; software EFD Pro 8.2; tapped-inductor quasiresonant buck LED driver; temperature effect; thermal field; thermal simulation model; thermal stress analysis; voltage 176 V to 265 V; Light emitting diodes; Lighting; Reliability; Semiconductor device modeling; Temperature; Temperature measurement; Thermal analysis; LED driver; QR Tapped-Inductor Buck converter; Reliability; performance; temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Application Conference and Exposition (PEAC), 2014 International
  • Conference_Location
    Shanghai
  • Type

    conf

  • DOI
    10.1109/PEAC.2014.7038069
  • Filename
    7038069