• DocumentCode
    2674571
  • Title

    Pressure Induced Conductivity for High Power Switching

  • Author

    Veselka, Harvey ; Neuber, Andreas ; Dickens, James

  • Author_Institution
    Dept. of Electr. & Comput. Eng. & Phys., Texas Tech. Univ., Lubbock, TX
  • fYear
    2006
  • fDate
    14-18 May 2006
  • Firstpage
    219
  • Lastpage
    219
  • Abstract
    Summary form only given. Investigations of shock induced conductivity of non-crystalline insulators and crystalline semiconductors were performed. Although we measured the insulator-to-metallic state transition time and conductivity, the focus of this investigation was on the recovery phase of the induced conductivity (i.e. metallic-to-insulator state transition). The recovery time and shock conditions were measured with high speed electrical diagnostics. The goal of this research is to determine the feasibility of using shock induced conductivity as a means of producing a high power opening switch. To minimize switch losses, the insulator-to-metallic transition time and conductance is also important, but has been more widely studied. Initial impact studies have shown that certain insulator can be conductive for 100 microseconds and recover under modest voltage less than one microsecond using a ten gram explosive charge. Various shock intensities are used in the study. The shock is produced primarily with conventional commercial explosives. In addition, the impact of sample thickness and compression duration on the induced the conductivity were also studied. The correlation between modest voltage and high voltage recovery time and shut-off current were studied
  • Keywords
    electrical conductivity; metal-insulator transition; switchgear; crystalline semiconductors; high power switching; high speed electrical diagnostics; insulator-to-metallic state transition time; noncrystalline insulators; phase recovery; shock induced conductivity; Conductivity measurement; Crystallization; Electric shock; Explosives; Insulation; Metal-insulator structures; Phase measurement; Power semiconductor switches; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator Symposium, 2006. Conference Record of the 2006 Twenty-Seventh International
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    1-4244-0018-X
  • Electronic_ISBN
    1-4244-0019-8
  • Type

    conf

  • DOI
    10.1109/MODSYM.2006.365221
  • Filename
    4216173