Title :
Numerical Properties Of Algorithm-Based Fault-Tolerance For High Reliability Array Processors *
Author :
Bliss, William G. ; Lightner, Michael R. ; Friedlander, Benjamin
Author_Institution :
Texas A&M University
Keywords :
Algebra; Circuit faults; Decoding; Encoding; Fault tolerance; Fault tolerant systems; Optical arrays; Redundancy; Signal processing algorithms; Vectors;
Conference_Titel :
Signals, Systems and Computers, 1988. Twenty-Second Asilomar Conference on
DOI :
10.1109/ACSSC.1988.754623
