DocumentCode
2674620
Title
A fingerprint verification system using minutiae and wavelet based features
Author
Khan, Umair Mateen ; Khan, Shoab Ahmed ; Ejaz, Naveed ; Rehman, Riaz Ur
Author_Institution
Dept. of Comput. Eng., NUST, Islamabad, Pakistan
fYear
2009
fDate
19-20 Oct. 2009
Firstpage
291
Lastpage
296
Abstract
Minutiae based approach is most widely used for fingerprint matching. Minutiae can be extracted either directly from gray-scaled image or from a thinned image. During matching, finding an exact match depends on the best matched minutiae pairs from both images. For matching stage, different kinds of features are extracted from extracted minutiae. The structure of some features allows us to have rotation and translation invariance. Minutiae based approach also has some drawbacks because it requires very lengthy preprocessing operations for minutiae extraction and still can result in false minutiae. Previously, to overcome this problem some kind of post-processing is used, which also eliminates valid minutiae along with false ones. So eventually, we can say that the strength of matching algorithm depends on the strength of extracted features from fingerprint. In our research, we have presented a new approach which uses wavelet based features which are fused with minutiae based features for matching purpose. In particular, we find that among the algorithms we studied, our proposed work have significant effects on overall performance. Experiment results show that using these features have made the matching process much more accurate even in the presence of false minutiae.
Keywords
feature extraction; fingerprint identification; image colour analysis; image matching; wavelet transforms; feature extraction; fingerprint matching; fingerprint verification system; gray-scaled image; minutiae based features; minutiae extraction; wavelet based features; Bifurcation; Biometrics; Data mining; Digital images; Educational institutions; Feature extraction; Fingerprint recognition; Image quality; Safety; Security; Biometrics; Fingerprint; Minutiae; Verification; Wavelet; structure matching;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies, 2009. ICET 2009. International Conference on
Conference_Location
Islamabad
Print_ISBN
978-1-4244-5630-7
Electronic_ISBN
978-1-4244-5631-4
Type
conf
DOI
10.1109/ICET.2009.5353157
Filename
5353157
Link To Document