Title :
Comparative analysis of invariant schemes for logo classification
Author :
Arafat, S. Yasser ; Saleem, Muhammad ; Hussain, S. Afaq
Author_Institution :
Fac. of Comput., Riphah Int. Univ., Islamabad, Pakistan
Abstract :
Logo or Trademark is of high importance because it carries the goodwill of the company and the product. Products are mostly recognized by their brand logos. Their recognition is a major problem. A number of techniques are there for logo recognition. In this paper, a number of invariant techniques are compared to find out their effectiveness on various categories of brand logos. Techniques which were investigated are Hu´s Invariant Moments, Log-Polar Transform (LPT), Fourier-Mellin transform (FMT), Gradient Location-Orientation Histogram (GLOH). Experiments were performed on University of Marry Land (UMD) database. Results are given, along with recognition rate and time taken. Results show that GLOH performs the best with approximately 97% recognition rate but need a more computational time while on the other extreme FMT technique performs poorest with recognition rate with average of approx. 85% but with least computational time compared to all other techniques.
Keywords :
Fourier transforms; gradient methods; image recognition; invariance; trademarks; Fourier-Mellin transform; Hus invariant moments; Log Polar transform; Trademark; gradient location orientation histogram; invariant schemes comparative analysis; logo classification; logo recognition; Computer science; Computer vision; Fourier transforms; Histograms; Image analysis; Image recognition; Image retrieval; Monitoring; Pattern recognition; Shape; Fourier-Mellin; descriptor; feature; gloh; graphical logos; invariant moments; log-polar transform; logo recognition; textual logos;
Conference_Titel :
Emerging Technologies, 2009. ICET 2009. International Conference on
Conference_Location :
Islamabad
Print_ISBN :
978-1-4244-5630-7
Electronic_ISBN :
978-1-4244-5631-4
DOI :
10.1109/ICET.2009.5353163