DocumentCode :
2675137
Title :
Ultra-high-isolation BiCMOS switch for extremely wideband microwave and millimeter-wave systems
Author :
Huynh, C. ; Nguyen, C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
fYear :
2011
fDate :
2-7 Oct. 2011
Firstpage :
1
Lastpage :
2
Abstract :
A new RF switch architecture with ultra-high isolation and possible gain is proposed, analyzed and demonstrated using 0.18-μm BiCMOS technology. The new RF switch architecture achieves an ultra-high isolation through implementation of a new RF leaking cancellation technique, in which the RF leaking signal is suppressed by combining with its replica using a balun. Its isolation is substantially higher than that produced by a conventional switch topology. The newly designed 0.18-μm BiCMOS RF switch exhibits an ultra-broadband performance from 10 to 38 GHz with -2.6-dB loss to 0.4-dB gain, isolation from 40 to about 70 dB, and input return loss from 8 to 20 dB under small signal conditions. Within 35.5-38.5 GHz, its isolation reaches extremely high values, with the highest isolation around 70 dB at 36 GHz. Measured insertion loss and isolation under large-signal conditions at 35 GHz show around 1-2 dB and 51.5 dB, respectively. The RF switch consumes a dc current of only 8 mA from a 1.8 V source. The extremely high isolation achievable by the new RF switch demonstrates the possibility of pushing RF system performance limited by switch isolation to a next level.
Keywords :
BiCMOS integrated circuits; baluns; field effect MIMIC; field effect MMIC; microwave switches; millimetre wave devices; BiCMOS technology; RF leaking cancellation technique; RF leaking signal; RF switch architecture; balun; current 8 mA; frequency 10 GHz to 38.5 GHz; gain 0.4 dB; loss -2.6 dB; loss 1 dB to 2 dB; loss 51.5 dB; loss 8 dB to 20 dB; size 0.18 mum; switch topology; ultra-broadband performance; ultra-high-isolation BiCMOS switch; voltage 1.8 V; wideband microwave system; wideband millimeter-wave system; Gain; Impedance matching; Loss measurement; Radio frequency; Semiconductor device measurement; Switches; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
ISSN :
2162-2027
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
Type :
conf
DOI :
10.1109/irmmw-THz.2011.6105055
Filename :
6105055
Link To Document :
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