DocumentCode :
2675401
Title :
Hybrid wafer scale interconnection inventing a new technology
Author :
Schmidt, Richard
Author_Institution :
Rockwell Int., Anaheim, CA, USA
fYear :
1990
fDate :
23-25 Jan 1990
Firstpage :
308
Lastpage :
316
Abstract :
Describes a monolithic multilayer thin film technology featuring discretionary wiring and a cellular design methodology which borrows heavily from VLSI design/fabrication technology. Referred to herein as Hybrid Wafer Scale Interconnect (HWSI), it preserves in many ways the advantages of monolithic Wafer Scale Integration (WSI), while simultaneously offering higher yield and superior performance typically associated with optimized subassemblies. It is noteworthy that many `monolithic´ WSI systems currently under development utilize the same, or even more discrete subassemblies, than the proposed HWSI technology
Keywords :
VLSI; hybrid integrated circuits; HWSI; Hybrid Wafer Scale Interconnect; cellular design methodology; discrete subassemblies; discretionary wiring; hybrid WSI; monolithic multilayer thin film technology; Costs; Design methodology; Fabrication; Integrated circuit interconnections; Integrated circuit technology; Microelectronics; Roads; Silicon; Space technology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9013-5
Type :
conf
DOI :
10.1109/ICWSI.1990.63914
Filename :
63914
Link To Document :
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