Title :
THz near-field microscopy applications in device research
Author :
Mitrofanov, Oleg
Author_Institution :
Electron. & Electr. Eng. Dept., Univ. Coll. London, London, UK
Abstract :
THz near-field microscopy can make a large impact on development of THz technology. Sub-wavelength spatial resolution and the possibility of time-domain analysis make this method particularly useful in research on THz devices. Applications for device research, including mode analysis in waveguides and surface plasmon wave mapping will be discussed.
Keywords :
optical microscopy; surface plasmons; time-domain analysis; subwavelength spatial resolution; surface plasmon wave mapping; terahertz near-field microscopy applications; time-domain analysis; Apertures; Dispersion; Microscopy; Plasmons; Probes; Surface waves;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
DOI :
10.1109/irmmw-THz.2011.6105086
