DocumentCode
2675802
Title
Reliability evaluation of multiple facility faults for sub-transmission systems using tabu search and cluster analysis
Author
Shimoda, Eisuke ; Ohtake, Hiroshi ; Iwamoto, Shinichi ; Namba, Masayuki
Author_Institution
Dept. of Electr. Eng. & Bioscience, Waseda Univ., Tokyo
fYear
0
fDate
0-0 0
Abstract
By the unbalanced concentration of transmission lines in recent years, the occurrences of multiple facility faults have become a great concern for sub-transmission power systems. In this paper, the problem of multiple facility faults is dealt with quantitatively. We use outage power and outage electric energy as the reliability indices. By the use of these indices the scale of a fault and the time required for the restoration are evaluated. In sub-transmission power systems, the number of the system composition is large. Therefore it is difficult to find an optimal system composition and a restoration procedure. In this paper, we introduce the tabu search method and the cluster analysis in order to find a solution easily. We simulate the proposed method by using an IEEJ sub-transmission system model (a 66 kV suburban system) in order to verify the validity of the proposed method
Keywords
pattern clustering; power system restoration; power transmission faults; power transmission reliability; search problems; statistical analysis; 66 kV; cluster analysis; multiple facility faults; optimal system composition; outage electric energy; outage power; reliability evaluation; reliability indices; restoration procedure; subtransmission power systems; tabu search; transmission lines; Circuit faults; Distributed parameter circuits; Power overhead lines; Power system analysis computing; Power system faults; Power system reliability; Power system restoration; Power system simulation; Power transmission lines; Search methods; Cluster Analysis; Tabu Search; multiple facility faults; quantitative reliability; sub-transmission system;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Society General Meeting, 2006. IEEE
Conference_Location
Montreal, Que.
Print_ISBN
1-4244-0493-2
Type
conf
DOI
10.1109/PES.2006.1709106
Filename
1709106
Link To Document