DocumentCode :
2676032
Title :
Nanosecond pulsed electric fields cause melanomas to self-destruct
Author :
Nuccitelli, Richard ; Pliquett, Uwe ; Chen, Xinhua ; Ford, Wentia ; Swanson, R. ; Beebe, Stephen ; Kolb, Juergen ; Schoenbach, Karl
Author_Institution :
Res. Center for Bioelectr., Old Dominion Univ., Norfolk, VA
fYear :
2006
fDate :
14-18 May 2006
Firstpage :
553
Lastpage :
553
Abstract :
Nanosecond pulsed electric fields (nsPEF) have been shown to penetrate into living cells to permeabilize intracellular organelles and release Ca2+ from the endoplasmic reticulum. They provide a new approach for physically targeting intracellular organelles with many applications, including initiation of apoptosis, enhancement of gene transfection efficiency and inhibiting tumor growth. We have been working with the murine melanoma model system and here we show that 40 kV/cm electric field pulses 300 nanoseconds in duration can rapidly stimulate pyknosis, reduce blood flow and fragment DNA in murine melanoma tumors in vivo with a total field exposure time of 1.8 microseconds. Three treatments of 100 pulses each results in a mean tumor size regression of 90% within two weeks. Another round of treatments at this time can completely eliminate the melanoma. This new therapy is the first to simultaneously trigger pyknosis and reduce tumor blood flow.
Keywords :
DNA; bioelectric phenomena; biological effects of fields; cellular effects of radiation; haemodynamics; haemorheology; Ca2+; endoplasmic reticulum; intracellular organelles; living cells; murine melanoma model; nanosecond pulsed electric field; nsPEF; tumor blood flow; Bioelectric phenomena; Blood flow; Cells (biology); DNA; In vivo; Malignant tumors; Medical treatment; Neoplasms; Skin; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 2006. Conference Record of the 2006 Twenty-Seventh International
Conference_Location :
Arlington, VA
Print_ISBN :
1-4244-0018-X
Type :
conf
DOI :
10.1109/MODSYM.2006.365310
Filename :
4216262
Link To Document :
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