Title : 
Optimization of wafer scale H-tree clock distribution network based on a new statistical skew model
         
        
            Author : 
Jiang, Xiaohong ; Horiguchi, Susumu
         
        
            Author_Institution : 
Graduate Sch. of Inf. Sci., JAIST, Ishikawa, Japan
         
        
        
        
        
        
            Abstract : 
Available statistical skew model is too conservative to estimate the expected clock skew of a well-balanced H-tree. New closed form model is presented for accurately estimating the expected values and the variances of both clock skew and the largest clock delay of a well-balanced H-tree. Based on the new model, clock period optimization of wafer scale H-tree clock network is investigated under two clocking modes. We find that when the conventional clocking mode is used, clock period optimization of wafer scale H-tree is reduced to the minimization of expected largest clock delay under both area restriction and power restriction. On the other hand, when the pipelined clocking mode is considered, the optimization is reduced to the minimization of expected clock skew under power restriction
         
        
            Keywords : 
circuit optimisation; clocks; delays; microprocessor chips; multiprocessing systems; pipeline processing; trees (mathematics); wafer-scale integration; area restriction; clock delay; clock period optimization; clocking modes; closed form model; expected clock skew; pipelined clocking mode; power restriction; statistical skew model; wafer scale H-tree clock distribution network; Clocks; Delay estimation; Impedance; Information science; Integrated circuit interconnections; Integrated circuit technology; Minimization; Propagation delay; Semiconductor device modeling; System performance;
         
        
        
        
            Conference_Titel : 
Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
         
        
            Conference_Location : 
Yamanashi
         
        
        
            Print_ISBN : 
0-7695-0719-0
         
        
        
            DOI : 
10.1109/DFTVS.2000.887147