DocumentCode
2676454
Title
Fault-tolerant ring- and toroidal mesh-connected processor arrays able to enhance emulation of hypercubes
Author
Tsuda, Nobuo
Author_Institution
Kanazawa Inst. of Technol., Ishikawa, Japan
fYear
2000
fDate
2000
Firstpage
222
Lastpage
230
Abstract
An advanced spare-connection scheme for k-out-of-n redundancy is proposed for constructing fault-tolerant ring- or toroidal mesh-connected arrays of processing nodes able to enhance emulation of binary hypercubes by using bypass networks. With this scheme, a component redundancy configuration for a base array with a fixed number of primary nodes, such as that for 8-node ring or 32-node toroidal mesh, can be constructed by using bypass links with a segmented bus structure to selectively connect the primary nodes to a spare node in parallel. These bypass links are allocated to the primary nodes by graph-node coloring with a minimum inter-node distance of three in order to use the bypass links as the hypercube connections as well as to attain strong fault tolerance for reconfiguring the base array with the primary network topology. An extended redundancy configuration for a large fault-tolerant array can be constructed by connecting the component configurations by using external switches of a hub type provided at the bus nodes of the bypass links. This configuration has a network topology of the parallel star-connections of sub-hypercubes whose diameter is smaller than that of the regular hypercube
Keywords
fault tolerant computing; graph colouring; hypercube networks; parallel processing; redundancy; binary hypercubes; bypass links; bypass networks; extended redundancy configuration; external switches; fault-tolerant computing; graph-node coloring; inter-node distance; k-out-of-n redundancy; parallel star-connections; primary network topology; processing nodes; ring-connected processor arrays; segmented bus structure; toroidal mesh-connected processor arrays; Computer networks; Emulation; Fault tolerance; Fault tolerant systems; High performance computing; Hypercubes; Joining processes; Network topology; Redundancy; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
Conference_Location
Yamanashi
ISSN
1550-5774
Print_ISBN
0-7695-0719-0
Type
conf
DOI
10.1109/DFTVS.2000.887160
Filename
887160
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