DocumentCode
2676646
Title
Analysis of Trapped Image Guides Using Effective Dielectric Constants and Surface Impedances
Author
Zhou, W.B. ; Itoh, T.
fYear
1982
fDate
15-17 June 1982
Firstpage
295
Lastpage
297
Abstract
Trapped image guides are analyzed using a new method. The results agree much better with experimental data than those previously derived from a simple effective dielectric constant approach.
Keywords
Dielectric constant; Dielectric losses; Distributed parameter circuits; Equations; Image analysis; Millimeter wave integrated circuits; Millimeter wave technology; Region 5; Resonance; Surface impedance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1982 IEEE MTT-S International
Conference_Location
Dallas, TX, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1982.1130696
Filename
1130696
Link To Document