A new light-based logic IC screening method

This paper describes a new screening method to combine I_dd leakage current testing with light exposure on the surface of CMOS logic chips. The relationship between light and I_dd leakage current is well known, and this new screening method makes use of the relationship. The I_dd leakage current is tested both with and without light on the surface of the device under test (DUT). Then the measured values are compared, and there is a clear difference in these measurements for good and bad devices. By carefully analyzing these measurements, a new screening method was developed and implemented in the production line to reduce testing time and cost