Author index

fYear

2000

fDate

27-27 Oct. 2000

Firstpage

421

Lastpage

422

Abstract

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on

Conference_Location

Yamanashi, Japan

ISSN

1550-5774

Print_ISBN

0-7695-0719-0

Type

conf

DOI

10.1109/DFTVS.2000.887183

Filename

887183

Link To Document