DocumentCode :
2676969
Title :
Microstrip Measurements
Author :
Edwards, T.C.
fYear :
1982
fDate :
15-17 June 1982
Firstpage :
338
Lastpage :
341
Abstract :
Extensive measurements are essential for the characterisation of microstrip and design using this medium. Resonator methods are significant and these are given prominence in this tutorial/overview paper. Brief considerations are included of parallel-coupled microstrips, Q-factor measurements, and TDR techniques.
Keywords :
Circuit testing; Electric variables measurement; Electrooptical waveguides; Frequency domain analysis; Frequency measurement; Microstrip resonators; Permittivity measurement; Q factor; Signal resolution; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1982 IEEE MTT-S International
Conference_Location :
Dallas, TX, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1982.1130712
Filename :
1130712
Link To Document :
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