• DocumentCode
    2677025
  • Title

    A Programmable Load for Power and Noise Characterization

  • Author

    Leake, B.W.

  • fYear
    1982
  • fDate
    15-17 June 1982
  • Firstpage
    348
  • Lastpage
    350
  • Abstract
    A digitally-controlled one-port tuner, providing sixty-four distinct impedances, has been used to examine the relationship between nonlinear power transistor performance and load impedance. In a similar way, the noise parameters of low noise linear transistors have been deduced from measurements using the tuner to control source impedance. All control, measurement and data reduction functions are performed with a desktop computer.
  • Keywords
    Equations; Frequency; Impedance; Noise figure; Noise measurement; Power measurement; Power transistors; Pulse measurements; Reflection; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1982 IEEE MTT-S International
  • Conference_Location
    Dallas, TX, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1982.1130715
  • Filename
    1130715