DocumentCode
2677025
Title
A Programmable Load for Power and Noise Characterization
Author
Leake, B.W.
fYear
1982
fDate
15-17 June 1982
Firstpage
348
Lastpage
350
Abstract
A digitally-controlled one-port tuner, providing sixty-four distinct impedances, has been used to examine the relationship between nonlinear power transistor performance and load impedance. In a similar way, the noise parameters of low noise linear transistors have been deduced from measurements using the tuner to control source impedance. All control, measurement and data reduction functions are performed with a desktop computer.
Keywords
Equations; Frequency; Impedance; Noise figure; Noise measurement; Power measurement; Power transistors; Pulse measurements; Reflection; Tuners;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1982 IEEE MTT-S International
Conference_Location
Dallas, TX, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1982.1130715
Filename
1130715
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