DocumentCode
2677102
Title
Electrical contact phenomena of nickel electrodeposits with sharp micro-asperities
Author
Law, H.H. ; Holden, C.A. ; Sapjeta, J. ; Crane, G.R. ; Nakahara, S.
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
fYear
1990
fDate
20-24 Aug 1990
Firstpage
651
Lastpage
659
Abstract
The electrical contact phenomena of gray nickel deposits with unique surface asperities are studied. An insulating oxide layer is assumed to exist because there is no evidence to support its absence. Since the oxide film is known to be as strong as the metal and it scarcely ruptures at contact, the emphasis is to determine which particular surface features contribute to low values of contact resistance, especially after the coating is exposed to humidity testing. Reflection electron micrographs showed that the nickel coatings with low R c after humidity exposure have sharp asperities on the surface. The oxide layer of these surfaces is shown not to be tenacious since the film resistivity depends strongly on the contact force. These sharp micro-asperities appear to account for the low R c behavior of gray coatings, as they disrupt the insulating film upon mechanical contact to create many small breaks in the oxide layer. Electrical contact then occurs through these breaks. At a load of 39 g or higher, the oxide is ruptured and the R c is reduced to a low, stable value with or without exposure to an accelerated oxidizing environment
Keywords
contact resistance; electrical contacts; electrodeposits; humidity; nickel alloys; phosphorus alloys; NiP electrodeposits; contact materials; contact resistance; electrical contact phenomena; humidity testing; insulating oxide layer; oxide film; sharp asperities; sharp micro-asperities; surface asperities; surface features; Coatings; Contact resistance; Electrons; Humidity; Insulation; Nickel; Optical films; Reflection; Surface resistance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts
Conference_Location
Montreal, Que.
Type
conf
DOI
10.1109/HOLM.1990.113072
Filename
113072
Link To Document