• DocumentCode
    267711
  • Title

    RF filter characterization using a chirp

  • Author

    Sarson, Peter

  • Author_Institution
    Ams AG, Unterpremstaetten, Austria
  • fYear
    2014
  • fDate
    16-18 Dec. 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Historically test engineers have had the problem that during debug of initial silicon that they are asked to characterize certain parts of the device. This adds time pressure as this is never part of the test quotation which also adds cost pressure since this takes extra test time and tester time to develop. The following topic will discuss a simple to develop method that will characterize a filter using a chirp to sweep the filters´ frequency range. The Digital Signal Processing (DSP) behind this will also be covered.
  • Keywords
    chirp modulation; digital signal processing chips; radiofrequency filters; semiconductor device testing; DSP; RF filter; digital signal processing; test engineers; Decision support systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (IDT), 2014 9th International
  • Conference_Location
    Algiers
  • Type

    conf

  • DOI
    10.1109/IDT.2014.7038576
  • Filename
    7038576
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=267711