DocumentCode
2677212
Title
WSI implemented with button board interconnection
Author
Arcos, J.T. ; Kamiyama, W.T. ; Swartzlander, E.E. ; Young, W.K.
Author_Institution
TRW, Redondo Beach, CA, USA
fYear
1990
fDate
23-25 Jan 1990
Firstpage
317
Lastpage
321
Abstract
Development of a cheap, high yield interconnection technology is crucial to implementing WSI circuits. However, limitations in process yield and design complexity experienced with monolithic (on-wafer) interconnect have prevented WSI from being commercially feasible. Button contacts, by providing a means of interconnecting working die for WSI processors external to the wafer, fulfil the requirements of WSI at significantly lower cost than monolithic approaches. After probe test, a printed circuit board is combined with button contacts to provide a flexible method of achieving the discretionary interconnect to good die. A prototype package has been built which demonstrates the feasibility of the authors´ WSI interconnect and packaging approach. The authors discuss the button board packaging approach, the electrical characteristics of their button contact interconnect along with future applications of this technology
Keywords
VLSI; integrated circuit technology; packaging; WSI; WSI interconnect; button board interconnection; button board packaging approach; button contacts; cheap interconnection technology; design complexity; discretionary interconnect to good die; electrical characteristics; high yield interconnection technology; interconnecting working die; low cost; lower cost; printed circuit board; process yield; prototype package; Circuit testing; Contacts; Costs; Electric variables; Flexible printed circuits; Integrated circuit interconnections; Packaging; Probes; Process design; Prototypes;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location
San Francisco, CA
Print_ISBN
0-8186-9013-5
Type
conf
DOI
10.1109/ICWSI.1990.63915
Filename
63915
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