• DocumentCode
    267723
  • Title

    Nonvolatile memories: Present and future challenges

  • Author

    Vatajelu, Elena Ioana ; Aziza, Hassen ; Zambelli, Cristian

  • Author_Institution
    Dip. di Autom. e Inf., Politec. di Torino, Turin, Italy
  • fYear
    2014
  • fDate
    16-18 Dec. 2014
  • Firstpage
    61
  • Lastpage
    66
  • Abstract
    Due to the rapid development of hand-held electronic devices, the need for high density, low power, high performance SoCs has pushed the well-established embedded memory technologies to their limits. To overcome the existing memory issues, emerging memory technologies are being developed and implemented. The focus is placed on non-volatile technologies, which should meet the high demands of tomorrow applications. The nonvolatile memory technologies being intensively researched today are the Flash memories and the emerging resistive and magnetic type random access memories. This paper presents an overview of device level operation of these nonvolatile memories, with special emphasis on the fabrication-and aging-induced reliability issues.
  • Keywords
    MRAM devices; flash memories; reliability; resistive RAM; aging-induced reliability; device level operation; fabrication-induced reliability; flash memories; magnetic type random access memories; nonvolatile memories; nonvolatile technologies; resistive type random access memories; Computer architecture; Magnetic tunneling; Microprocessors; Nonvolatile memory; Random access memory; Resistance; Switches; Flash Memory; Magnetic RAM; Process Variability; Reliability; Resistive RAM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (IDT), 2014 9th International
  • Conference_Location
    Algiers
  • Type

    conf

  • DOI
    10.1109/IDT.2014.7038588
  • Filename
    7038588