DocumentCode :
267723
Title :
Nonvolatile memories: Present and future challenges
Author :
Vatajelu, Elena Ioana ; Aziza, Hassen ; Zambelli, Cristian
Author_Institution :
Dip. di Autom. e Inf., Politec. di Torino, Turin, Italy
fYear :
2014
fDate :
16-18 Dec. 2014
Firstpage :
61
Lastpage :
66
Abstract :
Due to the rapid development of hand-held electronic devices, the need for high density, low power, high performance SoCs has pushed the well-established embedded memory technologies to their limits. To overcome the existing memory issues, emerging memory technologies are being developed and implemented. The focus is placed on non-volatile technologies, which should meet the high demands of tomorrow applications. The nonvolatile memory technologies being intensively researched today are the Flash memories and the emerging resistive and magnetic type random access memories. This paper presents an overview of device level operation of these nonvolatile memories, with special emphasis on the fabrication-and aging-induced reliability issues.
Keywords :
MRAM devices; flash memories; reliability; resistive RAM; aging-induced reliability; device level operation; fabrication-induced reliability; flash memories; magnetic type random access memories; nonvolatile memories; nonvolatile technologies; resistive type random access memories; Computer architecture; Magnetic tunneling; Microprocessors; Nonvolatile memory; Random access memory; Resistance; Switches; Flash Memory; Magnetic RAM; Process Variability; Reliability; Resistive RAM;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Test Symposium (IDT), 2014 9th International
Conference_Location :
Algiers
Type :
conf
DOI :
10.1109/IDT.2014.7038588
Filename :
7038588
Link To Document :
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