Title :
GaAs company Q&R benchmarking results
Author :
Roesch, William J.
Author_Institution :
TriQuint Semicond. Inc., Beaverton, OR, USA
Abstract :
As a result of curiosity from the GaAs Reliability and Quality JEDEC Committee, a benchmarking exercise was chartered. Several companies have provided input to the benchmarking effort. This publication is intended to publicize the investigation and provide general results to the GaAs Community. The intent of this work is to provide baseline information on quality and reliability operations at gallium arsenide manufacturers. This information not only helps each manufacturer understand the other better, but allows for comparisons and development of "common ground" and opportunities for standardization
Keywords :
III-V semiconductors; gallium arsenide; quality control; reliability; GaAs; Reliability and Quality JEDEC Committee; company Q&R benchmarking; gallium arsenide manufacturers; quality; reliability; standardization; Acoustic testing; Atomic force microscopy; Failure analysis; Gallium arsenide; Indium tin oxide; Life testing; Manufacturing; Semiconductor device manufacture; Standardization; Temperature;
Conference_Titel :
GaAs Reliability Workshop, 1997., Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7908-0064-0
DOI :
10.1109/GAASRW.1997.656146
