DocumentCode
2677566
Title
Will They Report It? Ethical Attitude of Graduate Software Engineers in Reporting Bad News
Author
Sajeev, A.S.M. ; Crnkovic, Ivica
Author_Institution
Sch. of Sci. & Technol., Univ. of New England, Armidale, NSW, Australia
fYear
2012
fDate
17-19 April 2012
Firstpage
42
Lastpage
51
Abstract
Hiding critical information has resulted in disastrous failures of some major software projects. This paper investigates, using a subset of Keil´s test, how graduates (70% of them with work experience) from different cultural backgrounds who are enrolled in a postgraduate course on global software development would handle negative information that is critical in a project. The subjects were mainly from Europe and Asia. The results showed that the subjects are highly likely to report critical information to their immediate supervisors (t(36)=-11, p<;0.0005), but are undecided on whether they would take the matter further up the organisational hierarchy if the supervisor ignored their report. There was no significant difference between participants of different regions, or between those with and without work experience. The consequences of negative information not reaching the level where remedial actions can be taken could be serious in software projects. The results of this experiment point to the need to incorporate in software engineering curriculum the teaching of the ethical responsibility of effective communication of bad news.
Keywords
data encapsulation; ethical aspects; organisational aspects; project management; software engineering; software management; teaching; Keil test; critical information hiding; disastrous failures; ethical attitude; global software development; organisational hierarchy; software engineering curriculum; software projects; teaching; Cultural differences; Educational institutions; Ethics; Europe; Programming; Software; Ethics education; Mum effect; Software project management;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering Education and Training (CSEE&T), 2012 IEEE 25th Conference on
Conference_Location
Nanjing, Jiangsu
ISSN
1093-0175
Print_ISBN
978-1-4673-1592-0
Type
conf
DOI
10.1109/CSEET.2012.31
Filename
6245006
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