• DocumentCode
    2677671
  • Title

    Characteristics of VCSEL arrays for parallel optical interconnects

  • Author

    Lebby, Michael ; Gaw, Craig A. ; Jiang, Wenbin ; Kiely, P.A. ; Shieh, Chan Long ; Claisse, P.R. ; Ramdani, Jamal ; Hartman, Davis H. ; Schwartz, Daniel B. ; Grula, Jerry

  • Author_Institution
    Photonics Technol. Centre, Motorola Inc., Tempe, AZ, USA
  • fYear
    1996
  • fDate
    28-31 May 1996
  • Firstpage
    279
  • Lastpage
    291
  • Abstract
    The use of vertical cavity surface emitting lasers (VCSELs)in a parallel optical interconnect for Motorola´s OPTOBUSTM interconnect was made public over 1 year ago. This was the first time VCSELs were introduced into a product which took advantage of the excellent qualities of VCSELs over edge-emitting lasers. Motorola´s OPTOBUSTM interconnect is a ten channel parallel bi-directional data link based on two 10 channel multimode fiber ribbons. One of the key differences in this type of interconnect compared with previous data link designs is the use of the VCSELs as the optical source for the link´s fiber optic transmitter. A single 1×10 VCSEL array from a GaAs wafer is die attached to a 10 channel GUIDECASTTM optical interface unit which couples the emission from each laser device to its corresponding fiber ribbon channel and thus negates the use of expensive manufacturing techniques such as active alignment and pigtailing. The OPTOBUSTM interconnect achieves its performance goals (which include low cost) via the unique characteristics of the GaAs VCSELs arrays. For example, the 850 nm devices produce a circular symmetric beam with a half angle of about 10 degrees allowing the coupling loss into the waveguide to be less than 3 dB. In addition, to maintain low manufacturing costs, each VCSEL array is individually and automatically probe tested (just as in the silicon industry) to verify that each VCSEL achieves the OPTOBUSTM interconnect´s stringent electrical, optical, thermal and mechanical specifications. Typical computer generated wafer maps from automated production tooling and statistical parametric results are discussed. The combination of low threshold currents with superior thermal and optical performance allow the devices to be modulated under fixed bias conditions. Typical drive currents of 3X threshold are used to obtain nominal FDA Class 1 safety optical power levels from the GUIDECASTTM optical interface unit
  • Keywords
    optical interconnections; semiconductor laser arrays; surface emitting lasers; 3 dB; 850 nm; GUIDECAST optical interface unit; GaAs; GaAs wafer; Motorola OPTOBUS; VCSEL array; automated production tooling; circular symmetric beam; computer generated wafer map; coupling loss; die attach; drive current; fiber optic transmitter; multi-channel bi-directional data link; multimode fiber ribbon; optical source; parallel optical interconnect; statistical parametric analysis; threshold current; vertical cavity surface emitting laser; Fiber lasers; Gallium arsenide; Nonlinear optics; Optical arrays; Optical interconnections; Optical modulation; Optical transmitters; Stimulated emission; Surface emitting lasers; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1996. Proceedings., 46th
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3286-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1996.517404
  • Filename
    517404