Title :
Scattering type phase for wetland classification using C-band polarimetric SAR
Author :
Touzi, R. ; Deschamps, A. ; Rother, G.
Author_Institution :
Canada Centre for Remote Sensing, Ottawa, ON
Abstract :
The Touzi decomposition is investigated for wetland characterization. Like the Cloude alpha scattering type, the magnitude alphas of the symmetric scattering is not effective for vegetation type discrimination. The phase Phialphas of the symmetric scattering type has to be used for enhanced characterization of wetland vegetation species. A new tool is introduced for assessment of the scattering type phase coherence, and the phase of the dominant scattering type is shown to be very promising for wetland target classification. The unique information provided by Phialphas for enhanced wetland class discrimination is demonstrated using Convair-580 polarimetric C-band SAR data collected over the Mer Bleue wetland in the East of Ottawa, Canada. The use of Phialphas makes possible the discrimination of shrub bog from sedges fen, and permits even the discrimination between conifer dominated treed bog from upland deciduous forest under leafy conditions.
Keywords :
electromagnetic wave scattering; geophysical signal processing; image classification; radar polarimetry; remote sensing by radar; synthetic aperture radar; vegetation; vegetation mapping; C-band polarimetric SAR; Canada; Cloude alpha scattering type; Convair-580 SAR; East of Ottawa; Mer Bleue wetland; Touzi decomposition; conifer dominated treed bog; scattering type phase coherence; sedges fen; shrub bog; upland deciduous forest; vegetation type discrimination; wetland classification; wetland vegetation species; Data mining; Eigenvalues and eigenfunctions; Energy measurement; Geophysical measurements; Matrix decomposition; Radar polarimetry; Radar scattering; Remote sensing; Scattering parameters; Vegetation; Classification; Radar Polarimetry; Synthetic aperture radar; Wetland;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4778983