Title :
Novel in-plane gap closing CMOS-MEMS microphone with no back-plate
Author :
Chun-i Chang ; Sung-Cheng Lo ; Chuanwei Wang ; Yi-Chiang Sun ; Weileun Fang
Author_Institution :
Inst. of NanoEngineering & Microsyst., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
The stacking of metal/tungsten layers as the sensing electrodes for CMOS-MEMS microphone without the back-plate has been proposed and demonstrated for the first time. The acoustic pressure will deform the spring-diaphragm structure and further cause the in-plane gap-closing between sensing electrodes. Thus, acoustic pressure and dynamic response of spring-suspension can be determined by the sensing capacitance changes. Such design has the following merits: (1) no back-plate is required, (2) bias voltage to pull diaphragm close to back-plate is not required, (3) in-use pull-in and process stiction between diaphragm and back-plate is also prevented, (4) easy integration with sensing circuits. The design was implemented using the standard TSMC CMOS process. Typical microphone with 200μm-diameter diaphragm and 48-pairs sensing electrodes has been realized. Measurements show the sensitivity of microphone is -64.78dBV/Pa at 1kHz.
Keywords :
CMOS integrated circuits; diaphragms; microelectrodes; micromechanical devices; microphones; tungsten; W; acoustic pressure; capacitance change; in-plane gap closing CMOS-MEMS microphone; metal-tungsten layer stacking; sensing electrodes; size 200 mum; spring suspension; spring-diaphragm structure; Acoustics; Electrodes; Frequency measurement; Metals; Micromechanical devices; Microphones; Sensors;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
Conference_Location :
San Francisco, CA
DOI :
10.1109/MEMSYS.2014.6765592