DocumentCode :
267806
Title :
Temperature-compensated piezoelectrically actuated Lamé-mode resonators
Author :
Thakar, Vikram ; Rais-Zadeh, Mina
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2014
fDate :
26-30 Jan. 2014
Firstpage :
214
Lastpage :
217
Abstract :
Electrostatically actuated Lamé-mode resonators are known to offer high quality factors (Q) in the low MHz frequency range but require large bias voltages and suffer from low power handling. In this work, we utilize piezoelectric transduction to circumvent the limitations of electrostatic actuation. Silicon dioxide refilled islands, used to achieve temperature compensation, are shown to provide a 20× improvement in the total charge pick-up, enabling piezoelectric actuation of Lamé-mode resonators. By optimizing the placement of the oxide-refilled islands and without changing the total oxide volume, the turnover temperature (TOT) can be designed to occur across a wide range from -40°C to +120°C without any significant Q degradation. Using such an approach multiple piezoelectric resonators with different TOTs can be fabricated on a single wafer, enabling multi-resonator systems stable across a wide temperature range.
Keywords :
crystal resonators; electrostatic actuators; piezoelectric transducers; electrostatic actuation; electrostatically actuated Lame-mode resonators; multiple piezoelectric resonator; piezoelectric actuation; piezoelectric transduction; piezoelectrically actuated Lame mode resonators; temperature -40 C to 120 C; temperature compensated resonator; Frequency measurement; III-V semiconductor materials; Resonant frequency; Silicon; Strain; Temperature distribution; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1109/MEMSYS.2014.6765613
Filename :
6765613
Link To Document :
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