• DocumentCode
    2678232
  • Title

    Growing the large lanthanum gallium silicate single crystals by Czochralski method

  • Author

    Dorogovin, B.A. ; Stepanov, S.Yu. ; Doubovski, A.B. ; Tsegleev, A.A. ; Lapteva, G.A. ; Kurochkin, V.Y. ; Philippov, I.M.

  • Author_Institution
    Res. Inst. for the Synthesis of Mater., Vladimir
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    169
  • Lastpage
    173
  • Abstract
    The authors have developed industrial technology to grow large single crystals of langasite having diameter of 86 mm and cylinder length of 100 mm. They were grown in the direction of the temperature compensated cuts (+48.5°; +50°; +54° to Y-axis) with Czochralski method. The present technology allows to make 3" (76.2 mm) langasite wafers. This diameter ensures the low losses of units by the wafer periphery in relation to the total number of units on the whole wafer surface. To grow langasite in direction of the temperature compensated cuts in contrast to Z-direction allows to make wafers by sawing ingots perpendicularly to the crystal axis
  • Keywords
    crystal growth from melt; gallium compounds; lanthanum compounds; piezoelectric materials; stoichiometry; Czochralski method; La3Ga5SiO14; SAW material; langasite; large single crystal growth; low losses; temperature compensated cuts; Aluminum oxide; Crystalline materials; Crystals; Furnaces; Heating; Lanthanum; Production; Resistors; Surface acoustic waves; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
  • Conference_Location
    Kansas City, MO
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-5838-4
  • Type

    conf

  • DOI
    10.1109/FREQ.2000.887347
  • Filename
    887347