DocumentCode :
2678232
Title :
Growing the large lanthanum gallium silicate single crystals by Czochralski method
Author :
Dorogovin, B.A. ; Stepanov, S.Yu. ; Doubovski, A.B. ; Tsegleev, A.A. ; Lapteva, G.A. ; Kurochkin, V.Y. ; Philippov, I.M.
Author_Institution :
Res. Inst. for the Synthesis of Mater., Vladimir
fYear :
2000
fDate :
2000
Firstpage :
169
Lastpage :
173
Abstract :
The authors have developed industrial technology to grow large single crystals of langasite having diameter of 86 mm and cylinder length of 100 mm. They were grown in the direction of the temperature compensated cuts (+48.5°; +50°; +54° to Y-axis) with Czochralski method. The present technology allows to make 3" (76.2 mm) langasite wafers. This diameter ensures the low losses of units by the wafer periphery in relation to the total number of units on the whole wafer surface. To grow langasite in direction of the temperature compensated cuts in contrast to Z-direction allows to make wafers by sawing ingots perpendicularly to the crystal axis
Keywords :
crystal growth from melt; gallium compounds; lanthanum compounds; piezoelectric materials; stoichiometry; Czochralski method; La3Ga5SiO14; SAW material; langasite; large single crystal growth; low losses; temperature compensated cuts; Aluminum oxide; Crystalline materials; Crystals; Furnaces; Heating; Lanthanum; Production; Resistors; Surface acoustic waves; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO
ISSN :
1075-6787
Print_ISBN :
0-7803-5838-4
Type :
conf
DOI :
10.1109/FREQ.2000.887347
Filename :
887347
Link To Document :
بازگشت