Study and proposal of alpha-grade evaluation procedure for synthetic quartz crystal

Author

Ikeda, M. ; Kurashige, M. ; Maeda, S. ; Mikawa, Y. ; Nagai, K. ; Takahashi, J. ; Takashima, H. ; Kyono, M. ; Yamamoto, N.

Author_Institution

Quartz Crystal Ind. Assoc. of Japan, Tokyo, Japan

fYear

2000

fDate

2000

Firstpage

206

Lastpage

213

Abstract

The authors studied the measurement method of alpha values on synthetic quartz, to solve the discrepancy of grade evaluation between different wavenumbers that is involved in IEC 60758 second edition 1993-04, and to minimize alpha value difference between different measuring instruments. The solution is proposed in this paper. Those are proper instrument calibration, standard samples and the values, and new alpha grade table. The result can be applied to Fourier Transform Infrared Spectrometer (FTIR)

Keywords

calibration; crystal resonators; infrared spectroscopy; measurement standards; piezoelectric materials; quartz; Fourier Transform Infrared Spectrometer; IEC 60758; SiO₂; alpha value difference; alpha-grade evaluation; grade evaluation; instrument calibration; standard samples; synthetic quartz crystal; Apertures; Atmospheric measurements; Calibration; Detectors; Gratings; Infrared spectra; Instruments; Proposals; Round robin; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International

Conference_Location

Kansas City, MO

ISSN

1075-6787

Print_ISBN

0-7803-5838-4

Type

conf

DOI

10.1109/FREQ.2000.887355

Filename

887355