DocumentCode :
2678481
Title :
Properties of Silicon Carbide nanotubes formed via reaction of SiO powder with SWCNTs and MWCNTs
Author :
Tan, William ; Hunley, Patrick ; Omer, Ingrid St
Author_Institution :
Syracuse Univ., Syracuse, NY, USA
fYear :
2009
fDate :
5-8 March 2009
Firstpage :
230
Lastpage :
235
Abstract :
Experiments to synthesize Silicon Carbide (SiC) nanotubes using single walled carbon nanotubes (SWCNTs) and multi-walled carbon nanotubes (MWCNTs) were preformed. Several experiments were conducted under vacuum in a high-temperature furnace varying temperature (1300degC-1450degC) and time. The optimal factors in synthesizing SiC nanostructures with MWCNTs were setting the dwell time to 6 hrs at 1450degC. While the optimal factor with SWCNTs was setting the dwell time to 30 mins at 1450degC. In general, samples were calcinated for 30 mins in 750degC. In both experiments, X-ray diffraction (XRD) patterns indicate our predominant polytype of SiC formed was 3C-SiC. Transmission electron microscopy (TEM) of our 6 hr experiment shows SiC nanostructures with polycrystalline layers and exhibiting a unique disk stacking structure. Scanning electron microscopy (SEM) of our 30 min experiment show fibrous and long nanotubes in which TEM and energy dispersive spectroscopy (EDS) indicate to be grains of SiC.
Keywords :
X-ray diffraction; calcination; nanotubes; scanning electron microscopy; silicon compounds; transmission electron microscopy; SiC; X-ray diffraction; energy dispersive spectroscopy; polycrystalline layers; scanning electron microscopy; single walled carbon nanotubes; temperature 1450 degC; temperature 750 degC; time 30 min; time 6 hour; transmission electron microscopy; Carbon nanotubes; Furnaces; Nanostructures; Powders; Scanning electron microscopy; Silicon carbide; Temperature; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon, 2009. SOUTHEASTCON '09. IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-3976-8
Electronic_ISBN :
978-1-4244-3978-2
Type :
conf
DOI :
10.1109/SECON.2009.5174082
Filename :
5174082
Link To Document :
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