• DocumentCode
    267870
  • Title

    Concurrent reactive ion etching employing micromachined ionic liquid ion source array

  • Author

    Yoshida, Ryuya ; Hara, Masaki ; Oguchi, H. ; Suzuki, Takumi ; Kuwano, Hiroki

  • Author_Institution
    Tohoku Univ., Sendai, Japan
  • fYear
    2014
  • fDate
    26-30 Jan. 2014
  • Firstpage
    463
  • Lastpage
    466
  • Abstract
    This paper describes concurrent reactive ion etching using micro ionic liquid ion source (ILIS) array. The system consists of micro needle emitters and a reservoir for the ionic liquid (IL) of 1-ethyl-3-methylimidazolium tetrafluoroborate ([EMIM]-[BF4]). The ion beam etching of a (100) silicon substrate using the fabricated ILIS array was demonstrated. As a result of mass spectroscopy during the etching, the peaks of SiF+, SiF2+, and SiF3+ were observed. The chemical reaction between the silicon and fluorine based ions from the IL was confirmed. Also, etching rate of the silicon using the ILIS array applying 5.1 kV ion-acceleration voltage was calculated from the etched dimple on the substrate and was 1.5 times larger than that of a conventional focused Ga+ ion beam applying 30 kV ion-acceleration voltage.
  • Keywords
    ion emission; ion sources; mass spectroscopy; micromechanical devices; silicon compounds; sputter etching; 1-ethyl-3-methylimidazolium tetrafluoroborate; EMIM-BF4; chemical reaction; concurrent reactive ion etching; etched dimple; etching rate; fluorine based ions; ion beam etching; ion-acceleration voltage; mass spectroscopy; micro ILIS array; micro ionic liquid ion source array; micro needle emitters; reservoir; silicon based ions; silicon substrate; Arrays; Etching; Ion beams; Ion sources; Liquids; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2014.6765677
  • Filename
    6765677