DocumentCode
2678749
Title
Analysis of thickness modes of contoured, doubly-rotated quartz resonators
Author
EerNisse, Errol P.
Author_Institution
Quartzdyne Inc., Salt Lake City, UT, USA
fYear
2000
fDate
2000
Firstpage
334
Lastpage
339
Abstract
It is shown that the theoretical development of D.S. Stevens and H.F. Tiersten (1986) can be used for calculating all three mode families of a doubly-rotated, contoured quartz resonator. Their approach uses a transformation of the mechanical displacement vector to the eigenvector triad of the pure thickness solution. The solution methodology here reorganizes the transformation matrix Q in their formulation to calculate the other two mode families. Calculations compare well with experimental results for the three mode families of an SC-cut crystal and an FC-cut crystal and with published calculations for the SBTC-cut mode family with major displacement along the x3 blank axis. The key constants for the SC-cut are presented for workers to use in the future
Keywords
crystal resonators; transfer function matrices; vibrations; FC-cut crystal; SBTC-cut mode family; SC-cut crystal; SiO2; contoured doubly-rotated quartz resonators; eigenvector triad; eigenvectors; elastic constants; equations of motion; mechanical displacement vector transformation; mode families; pure thickness solution; thickness modes; transformation matrix; Boundary conditions; Cities and towns; Equations; Frequency control; Temperature measurement; Temperature sensors; Tensile stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location
Kansas City, MO
ISSN
1075-6787
Print_ISBN
0-7803-5838-4
Type
conf
DOI
10.1109/FREQ.2000.887377
Filename
887377
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