• DocumentCode
    2678749
  • Title

    Analysis of thickness modes of contoured, doubly-rotated quartz resonators

  • Author

    EerNisse, Errol P.

  • Author_Institution
    Quartzdyne Inc., Salt Lake City, UT, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    334
  • Lastpage
    339
  • Abstract
    It is shown that the theoretical development of D.S. Stevens and H.F. Tiersten (1986) can be used for calculating all three mode families of a doubly-rotated, contoured quartz resonator. Their approach uses a transformation of the mechanical displacement vector to the eigenvector triad of the pure thickness solution. The solution methodology here reorganizes the transformation matrix Q in their formulation to calculate the other two mode families. Calculations compare well with experimental results for the three mode families of an SC-cut crystal and an FC-cut crystal and with published calculations for the SBTC-cut mode family with major displacement along the x3 blank axis. The key constants for the SC-cut are presented for workers to use in the future
  • Keywords
    crystal resonators; transfer function matrices; vibrations; FC-cut crystal; SBTC-cut mode family; SC-cut crystal; SiO2; contoured doubly-rotated quartz resonators; eigenvector triad; eigenvectors; elastic constants; equations of motion; mechanical displacement vector transformation; mode families; pure thickness solution; thickness modes; transformation matrix; Boundary conditions; Cities and towns; Equations; Frequency control; Temperature measurement; Temperature sensors; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
  • Conference_Location
    Kansas City, MO
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-5838-4
  • Type

    conf

  • DOI
    10.1109/FREQ.2000.887377
  • Filename
    887377