A low profile quartz crystal resonator for OXCO in cellular telephone system

Author

Soga, Tadayoshi ; Aoyama, Yuji ; Hara, Koichi

Author_Institution

TOYOCOM, Kanagawa, Japan

fYear

2000

fDate

2000

Firstpage

348

Lastpage

352

Abstract

We realized 15 mm-in-height quartz crystal resonator with aging characteristic of less than 2×10^-11/day and acceleration sensitivity of less than 1×10^-9/g. Large effort has been paid to the designing of the base structure. We designed the base as low as possible and at the same time, it should avoid the strain transmitting to the quartz plate caused by the coldweld sealing. The mounting angle was experimentally determined so that the acceleration sensitivity would be minimized. As a result, 4.5 mm-in-height quartz crystal resonator with excellent aging characteristic and small acceleration sensitivity was successfully realized

Keywords

cellular radio; crystal oscillators; frequency stability; seals (stoppers); surface mount technology; 4.5 mm; OXCO; SiO₂; aging characteristic; base structure; cellular telephone system; coldweld sealing strain; equivalent circuit parameters; low acceleration sensitivity; low profile; mounting angle; quartz crystal resonator; Accelerated aging; Acceleration; Assembly systems; Capacitive sensors; Frequency; Packaging; Springs; Telephony; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International

Conference_Location

Kansas City, MO

ISSN

1075-6787

Print_ISBN

0-7803-5838-4

Type

conf

DOI

10.1109/FREQ.2000.887380

Filename

887380