Title :
A low profile quartz crystal resonator for OXCO in cellular telephone system
Author :
Soga, Tadayoshi ; Aoyama, Yuji ; Hara, Koichi
Author_Institution :
TOYOCOM, Kanagawa, Japan
Abstract :
We realized 15 mm-in-height quartz crystal resonator with aging characteristic of less than 2×10-11/day and acceleration sensitivity of less than 1×10-9/g. Large effort has been paid to the designing of the base structure. We designed the base as low as possible and at the same time, it should avoid the strain transmitting to the quartz plate caused by the coldweld sealing. The mounting angle was experimentally determined so that the acceleration sensitivity would be minimized. As a result, 4.5 mm-in-height quartz crystal resonator with excellent aging characteristic and small acceleration sensitivity was successfully realized
Keywords :
cellular radio; crystal oscillators; frequency stability; seals (stoppers); surface mount technology; 4.5 mm; OXCO; SiO2; aging characteristic; base structure; cellular telephone system; coldweld sealing strain; equivalent circuit parameters; low acceleration sensitivity; low profile; mounting angle; quartz crystal resonator; Accelerated aging; Acceleration; Assembly systems; Capacitive sensors; Frequency; Packaging; Springs; Telephony; Temperature sensors;
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO
Print_ISBN :
0-7803-5838-4
DOI :
10.1109/FREQ.2000.887380
