DocumentCode

2678852

Title

Use of storage elements as primitives for modeling faults in synchronous sequential circuits

Author

Al-Assadi, Waleed K. ; Malaiya, Y.K. ; Jayasumana, A.P.

Author_Institution

Colorado State University

fYear

1993

fDate

3-6 Jan. 1993

Firstpage

118

Lastpage

123

Keywords

Circuit faults; Circuit testing; Clocks; Computer science; Fault detection; Latches; Logic design; Logic testing; Master-slave; Sequential circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 1993. Proceedings. The Sixth International Conference on

Conference_Location

Bombay, India

ISSN

1063-9667

Print_ISBN

0-8186-3180-5

Type

conf

DOI

10.1109/ICVD.1993.669660

Filename

669660