Title :
Use of storage elements as primitives for modeling faults in synchronous sequential circuits
Author :
Al-Assadi, Waleed K. ; Malaiya, Y.K. ; Jayasumana, A.P.
Author_Institution :
Colorado State University
Keywords :
Circuit faults; Circuit testing; Clocks; Computer science; Fault detection; Latches; Logic design; Logic testing; Master-slave; Sequential circuits;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Conference_Location :
Bombay, India
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669660
